These mission profiles contain information about how the component failure rate may be affected by operational cycling, ambient temperature variation and/or equipment switch on/off temperature variations. Component failure is defined in terms of an empirical expression containing a base failure rate that is multiplied by factors influenced by mission profiles. The RDF 2000 method provided a unique approach to handle mission profiles in the failure rate prediction.
This standard provides reliability prediction models for a range of electronic components using cycling profiles and applicable phases as a basis for failure rate calculations.
RDF 2000 is a reliability data handbook developed by the French telecommunications industry.
0 kommentar(er)
